Advanced Materials Characterization Techniques (Analytical)

This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis. X-ray Diffraction (XRD): Understanding crystal structures and phase identification in materials.

Spectroscopic Methods: in depth understanding of spectroscopic techniques like Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy. Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties. Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.

Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation. By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries.